Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials [electronic resource] / edited by Yoshio Waseda.

Contributor(s): Waseda, Yoshio [editor.] | SpringerLink (Online service)Material type: TextTextSeries: Lecture Notes in Physics ; 204Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 1984Description: VI, 186 p. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9783540389101Subject(s): Physics | Crystallography | Physics | CrystallographyAdditional physical formats: Printed edition:: No titleDDC classification: 548 LOC classification: QD901-999Online resources: Click here to access online
Contents:
A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects.
In: Springer eBooks
Item type: E-BOOKS
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A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects.

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