Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials [electronic resource] /
edited by Yoshio Waseda.
- Berlin, Heidelberg : Springer Berlin Heidelberg, 1984.
- VI, 186 p. online resource.
- Lecture Notes in Physics, 204 0075-8450 ; .
- Lecture Notes in Physics, 204 .
A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects.
9783540389101
10.1007/BFb0025745 doi
Physics.
Crystallography.
Physics.
Crystallography.
QD901-999
548
A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects.
9783540389101
10.1007/BFb0025745 doi
Physics.
Crystallography.
Physics.
Crystallography.
QD901-999
548