Transmission Electron Microscopy and Diffractometry of Materials

By: Fultz, Brent | Howe, JamesMaterial type: TextTextPublication details: Berlin ; Springer ; 2001Description: 748ISBN: 3 540 67841 7Subject(s): Materials - Microscopy Transmission Electron Microscopy X-Ray Diffractometer
Item type: BOOKS
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The Institute of Mathematical Sciences, Chennai, India

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