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Fultz, Brent. Howe, James.

Transmission Electron Microscopy and Diffractometry of Materials - Berlin Springer 2001 - 748

ISBN: 3 540 67841 7

Subjects--Topical Terms:
Materials - Microscopy
Transmission Electron Microscopy
X-Ray Diffractometer

Universal Decimal Class. No.: 539.18 FUL

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