Critical Phenomena at Surfaces and Interfaces (Record no. 43002)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 02621nam a22004935i 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9783540384564 |
| -- | 978-3-540-38456-4 |
| 245 10 - TITLE STATEMENT | |
| Title | Critical Phenomena at Surfaces and Interfaces |
| Sub Title | Evanescent X-Ray and Neutron Scattering / |
| Statement of responsibility, etc | edited by Helmut Dosch. |
| 260 #1 - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Berlin, Heidelberg : |
| Name of publisher | Springer Berlin Heidelberg, |
| Year of publication | 1992. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | X, 149 p. |
| Other physical details | online resource. |
| 490 1# - SERIES STATEMENT | |
| Series statement | Springer Tracts in Modern Physics, |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | Evanescent X-ray scattering -- Evanescent neutron scattering -- Semi-infinite critical systems -- Surface effects at first order phase transitions. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Physics. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Chemistry, Physical organic. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Crystallography. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Spectrum analysis. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Surfaces (Physics). |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Physics. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Optical Spectroscopy, Ultrafast Optics. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Physical Chemistry. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Crystallography. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Surfaces and Interfaces, Thin Films. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Characterization and Evaluation of Materials. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Dosch, Helmut. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://dx.doi.org/10.1007/BFb0045209 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | E-BOOKS |
| 264 #1 - | |
| -- | Berlin, Heidelberg : |
| -- | Springer Berlin Heidelberg, |
| -- | 1992. |
| 336 ## - | |
| -- | text |
| -- | txt |
| -- | rdacontent |
| 337 ## - | |
| -- | computer |
| -- | c |
| -- | rdamedia |
| 338 ## - | |
| -- | online resource |
| -- | cr |
| -- | rdacarrier |
| 347 ## - | |
| -- | text file |
| -- | |
| -- | rda |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
| -- | 0081-3869 ; |
| Withdrawn status | Lost status | Damaged status | Not for loan | Current library | Accession Number | Uniform Resource Identifier | Koha item type |
|---|---|---|---|---|---|---|---|
| IMSc Library | EBK13708 | http://dx.doi.org/10.1007/BFb0045209 | E-BOOKS |