Critical Phenomena at Surfaces and Interfaces Evanescent X-Ray and Neutron Scattering / [electronic resource] :
edited by Helmut Dosch.
- Berlin, Heidelberg : Springer Berlin Heidelberg, 1992.
- X, 149 p. online resource.
- Springer Tracts in Modern Physics, 126 0081-3869 ; .
- Springer Tracts in Modern Physics, 126 .
Evanescent X-ray scattering -- Evanescent neutron scattering -- Semi-infinite critical systems -- Surface effects at first order phase transitions.
This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
9783540384564
10.1007/BFb0045209 doi
Physics.
Chemistry, Physical organic.
Crystallography.
Spectrum analysis.
Surfaces (Physics).
Physics.
Optical Spectroscopy, Ultrafast Optics.
Physical Chemistry.
Crystallography.
Surfaces and Interfaces, Thin Films.
Characterization and Evaluation of Materials.
Evanescent X-ray scattering -- Evanescent neutron scattering -- Semi-infinite critical systems -- Surface effects at first order phase transitions.
This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
9783540384564
10.1007/BFb0045209 doi
Physics.
Chemistry, Physical organic.
Crystallography.
Spectrum analysis.
Surfaces (Physics).
Physics.
Optical Spectroscopy, Ultrafast Optics.
Physical Chemistry.
Crystallography.
Surfaces and Interfaces, Thin Films.
Characterization and Evaluation of Materials.