High-resolution x-ray scattering from thin films to lateral nanostructures

By: Pietsch, Ullrich | Holy, Vaclav | Baumbach, TiloMaterial type: TextTextPublication details: New York ; Springer ; 2004Edition: 2Description: 408ISBN: 0387400923
Item type: BOOKS
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IMSc Library
IMSc Library
535 PIE (Browse shelf (Opens below)) Available 55096

with 240 figures

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The Institute of Mathematical Sciences, Chennai, India

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