Formal Methods for Industrial Critical Systems [electronic resource] : 20th International Workshop, FMICS 2015 Oslo, Norway, June 22-23, 2015 Proceedings / edited by Manuel Núñez, Matthias Güdemann.

Contributor(s): Núñez, Manuel [editor.] | Güdemann, Matthias [editor.] | SpringerLink (Online service)Material type: TextTextSeries: Programming and Software Engineering ; 9128 | Lecture Notes in Computer Science ; 9128Publisher: Cham : Springer International Publishing : Imprint: Springer, 2015Edition: 1st ed. 2015Description: XVI, 213 p. 61 illus. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9783319194585Subject(s): Programming languages (Electronic computers) | Computer logic | Software engineering | Special purpose computers | Mathematical logic | Programming Languages, Compilers, Interpreters | Logics and Meanings of Programs | Software Engineering | Special Purpose and Application-Based Systems | Mathematical Logic and Formal LanguagesAdditional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification: 005.13 LOC classification: QA76.7-76.73QA76.76.C65Online resources: Click here to access online
Contents:
Applications.- Protocols -- Specification and analysis -- Verification.
In: Springer Nature eBookSummary: This book constitutes the proceedings of the 20th International Workshop on Formal Methods for Industrial Critical Systems, FMICS 2015, Oslo, Norway, in June 2015. The 12 papers presented in this volume were carefully reviewed and selected from 20 submissions. They are organized in topical sections: applications; protocols; specification and analysis; verification.
Item type: E-BOOKS
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Applications.- Protocols -- Specification and analysis -- Verification.

This book constitutes the proceedings of the 20th International Workshop on Formal Methods for Industrial Critical Systems, FMICS 2015, Oslo, Norway, in June 2015. The 12 papers presented in this volume were carefully reviewed and selected from 20 submissions. They are organized in topical sections: applications; protocols; specification and analysis; verification.

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