Surface Scattering Experiments with Conduction Electrons [electronic resource] / by Dieter Schumacher.
Material type: TextSeries: Springer Tracts in Modern Physics ; 128Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1993Description: IX, 97 p. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9783540474746Subject(s): Surfaces (Physics) | Materials Science | Surfaces and Interfaces, Thin FilmsAdditional physical formats: Printed edition:: No titleDDC classification: 620.44 LOC classification: TA418.7-418.76TA418.9.T45Online resources: Click here to access onlineCurrent library | Home library | Call number | Materials specified | URL | Status | Date due | Barcode |
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IMSc Library | IMSc Library | Link to resource | Available | EBK13710 |
The electrical conductivity of thin metal films -- Concepts to describe the surface influence -- Thin metal films on glass supports -- Studies of surface and growth processes -- Final remarks.
Surface Scattering Experiments with Conduction Electrons shows how this process can be used to investigate surface processes of thin metal films. Since a thin film is in one direction of a size comparable to the mean free path of the conduction electrons, such a film is both substrate and sensor and must be characterized by other surface-analytical methodsas demonstrated here. Also discussed is how the dc-resistivity measurement permits the study of surface processes such as adsorption, desorption, and surface diffusion up to crystalline growth. The in situ observation of epitaxial growth is additionally shown to be possible. Thus the electronic structure of superimposed metal films and superlattices can be elucidated. This is an essential topic for all surface physicists.
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