"The AMS-IMS-SIAM Joint Summer Research Conference in the Mathematical Sciences on Statistical Analysis of Measurement Error Models and Applications was held at Humboldt State University, Arcata, California..."--T.p. verso.

Some history of functional and structural relationships / Peter Sprent -- Errors-in-variables regression problems in epidemiology / Alice S. Whittemore -- Models with latent variables: LISREL versus PLS / Hans Schneeweiss -- Prediction of true values for the measurement error model / Wayne A. Fuller -- Analysis of residuals from measurement error models / Stephen M. Miller -- Errors-in-variables estimation in the presence of serially correlated observations / John L. Eltinge -- Improvements of the naive approach to estimation in nonlinear errors-in-variables regression models / Leon Jay Gleser -- Structural logistic regression measurement error models / Leonard A. Stefanski and Raymond J. Carroll -- Measurement error model estimation using iteratively weighted least squares / Daniel W. Schafer -- Problematic points in nonlinear calibration / Philip J. Brown and Samuel D. Oman -- Instrumental variable estimation of the nonlinear measurement error model / Yasuo Amemiya -- A likelihood ratio test for error covariance specification in nonlinear measurement error models / Daniel J. Schnell -- Plotting techniques for errors-in-variables problems / Cliff H. Spiegelman -- Perturbation theory and least squares with errors in the variables / G. W. Stewart -- Orthogonal distance regression / Paul T. Boggs and Janet E. Rogers -- Computing error bounds for regression problems / Nicholas J. Higham -- Asymptotic robustness of normal theory methods for the analysis of latent curves / M. W. Browne -- Bounded influence errors-in-variables regression / Chi Lun Cheng and John W. Van Ness -- Bounded influence estimation in the errors-in-variables model / V�ictor J. Yohai and Ruben H. Zamar --

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Electronic reproduction. Providence, Rhode Island : American Mathematical Society. 2012

Mode of access : World Wide Web

Description based on print version record.