Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications [electronic resource] : 16th Iberoamerican Congress, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings / edited by César San Martin, Sang-Woon Kim.
Material type:
TextSeries: Lecture Notes in Computer Science ; 7042Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2011Description: XVIII, 721p. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9783642250859Subject(s): Computer science | Computer software | Artificial intelligence | Computer vision | Optical pattern recognition | Biometrics | Computer Science | Pattern Recognition | Image Processing and Computer Vision | Artificial Intelligence (incl. Robotics) | Biometrics | Algorithm Analysis and Problem Complexity | Information Systems Applications (incl. Internet)Additional physical formats: Printed edition:: No titleDDC classification: 006.4 LOC classification: Q337.5TK7882.P3Online resources: Click here to access online
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Springer eBooksSummary: This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucón, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition.
E-BOOKS
| Current library | Home library | Call number | Materials specified | URL | Status | Date due | Barcode |
|---|---|---|---|---|---|---|---|
| IMSc Library | IMSc Library | Link to resource | Available | EBK10006 |
This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucón, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition.
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