000 -LEADER |
fixed length control field |
04142nam a22006375i 4500 |
001 - CONTROL NUMBER |
control field |
978-4-431-55800-2 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
DE-He213 |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20210120145111.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
160330s2015 ja | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9784431558002 |
-- |
978-4-431-55800-2 |
024 7# - OTHER STANDARD IDENTIFIER |
Standard number or code |
10.1007/978-4-431-55800-2 |
Source of number or code |
doi |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
QC610.9-611.8 |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TJFD5 |
Source |
bicssc |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TEC008090 |
Source |
bisacsh |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TJFD |
Source |
thema |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
537.622 |
Edition number |
23 |
245 10 - TITLE STATEMENT |
Title |
Defects and Impurities in Silicon Materials |
Medium |
[electronic resource] : |
Remainder of title |
An Introduction to Atomic-Level Silicon Engineering / |
Statement of responsibility, etc. |
edited by Yutaka Yoshida, Guido Langouche. |
250 ## - EDITION STATEMENT |
Edition statement |
1st ed. 2015. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
Place of production, publication, distribution, manufacture |
Tokyo : |
Name of producer, publisher, distributor, manufacturer |
Springer Japan : |
-- |
Imprint: Springer, |
Date of production, publication, distribution, manufacture, or copyright notice |
2015. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
XV, 487 p. 292 illus., 180 illus. in color. |
Other physical details |
online resource. |
336 ## - CONTENT TYPE |
Content type term |
text |
Content type code |
txt |
Source |
rdacontent |
337 ## - MEDIA TYPE |
Media type term |
computer |
Media type code |
c |
Source |
rdamedia |
338 ## - CARRIER TYPE |
Carrier type term |
online resource |
Carrier type code |
cr |
Source |
rdacarrier |
347 ## - DIGITAL FILE CHARACTERISTICS |
File type |
text file |
Encoding format |
PDF |
Source |
rda |
490 1# - SERIES STATEMENT |
Series statement |
Lecture Notes in Physics, |
International Standard Serial Number |
0075-8450 ; |
Volume/sequential designation |
916 |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Diffusion and point defects in silicon materials -- Density functional modeling of defects and impurities in silicon materials -- Electrical and optical defect evaluation techniques for electronic and solar grade silicon -- Intrinsic point defect engineering during single crystal Si and Ge growth from a melt -- Computer simulation of crystal growth for CZ-Si single crystals and Si solar cells -- Oxygen precipitation in silicon -- Defect characterization by electron beam induced current and cathode luminescence methods -- Nuclear methods to study defects and impurities in Si materials using heavy ion accelerators -- Defect Engineering in silicon materials. |
520 ## - SUMMARY, ETC. |
Summary, etc. |
This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques. The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Semiconductors. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Nanotechnology. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Engineering—Materials. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Solid state physics. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Nanoscale science. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Nanoscience. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Nanostructures. |
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Semiconductors. |
Authority record control number |
https://scigraph.springernature.com/ontologies/product-market-codes/P25150 |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Nanotechnology. |
Authority record control number |
https://scigraph.springernature.com/ontologies/product-market-codes/Z14000 |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Materials Engineering. |
Authority record control number |
https://scigraph.springernature.com/ontologies/product-market-codes/T28000 |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Nanotechnology and Microengineering. |
Authority record control number |
https://scigraph.springernature.com/ontologies/product-market-codes/T18000 |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Solid State Physics. |
Authority record control number |
https://scigraph.springernature.com/ontologies/product-market-codes/P25013 |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Nanoscale Science and Technology. |
Authority record control number |
https://scigraph.springernature.com/ontologies/product-market-codes/P25140 |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Yoshida, Yutaka. |
Relator term |
editor. |
Relator code |
edt |
-- |
http://id.loc.gov/vocabulary/relators/edt |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Langouche, Guido. |
Relator term |
editor. |
Relator code |
edt |
-- |
http://id.loc.gov/vocabulary/relators/edt |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer Nature eBook |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Relationship information |
Printed edition: |
International Standard Book Number |
9784431557999 |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Relationship information |
Printed edition: |
International Standard Book Number |
9784431558019 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
Uniform title |
Lecture Notes in Physics, |
International Standard Serial Number |
0075-8450 ; |
Volume number/sequential designation |
916 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
<a href="https://doi.org/10.1007/978-4-431-55800-2">https://doi.org/10.1007/978-4-431-55800-2</a> |
912 ## - |
-- |
ZDB-2-PHA |
912 ## - |
-- |
ZDB-2-SXP |
912 ## - |
-- |
ZDB-2-LNP |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Koha item type |
E-BOOKS |