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Critical Phenomena at Surfaces and Interfaces [electronic resource] : Evanescent X-Ray and Neutron Scattering / edited by Helmut Dosch.

Contributor(s): Material type: TextTextSeries: Springer Tracts in Modern Physics ; 126Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 1992Description: X, 149 p. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783540384564
Subject(s): Additional physical formats: Printed edition:: No titleOnline resources:
Contents:
Evanescent X-ray scattering -- Evanescent neutron scattering -- Semi-infinite critical systems -- Surface effects at first order phase transitions.
In: Springer eBooksSummary: This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
Item type: E-BOOKS
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Evanescent X-ray scattering -- Evanescent neutron scattering -- Semi-infinite critical systems -- Surface effects at first order phase transitions.

This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.

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