000 | 02621nam a22004935i 4500 | ||
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001 | 978-3-540-38456-4 | ||
003 | DE-He213 | ||
005 | 20160624102336.0 | ||
007 | cr nn 008mamaa | ||
008 | 121227s1992 gw | s |||| 0|eng d | ||
020 |
_a9783540384564 _9978-3-540-38456-4 |
||
024 | 7 |
_a10.1007/BFb0045209 _2doi |
|
245 | 1 | 0 |
_aCritical Phenomena at Surfaces and Interfaces _h[electronic resource] : _bEvanescent X-Ray and Neutron Scattering / _cedited by Helmut Dosch. |
260 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c1992. |
|
264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c1992. |
|
300 |
_aX, 149 p. _bonline resource. |
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336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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347 |
_atext file _bPDF _2rda |
||
490 | 1 |
_aSpringer Tracts in Modern Physics, _x0081-3869 ; _v126 |
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505 | 0 | _aEvanescent X-ray scattering -- Evanescent neutron scattering -- Semi-infinite critical systems -- Surface effects at first order phase transitions. | |
520 | _aThis book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness. | ||
650 | 0 | _aPhysics. | |
650 | 0 | _aChemistry, Physical organic. | |
650 | 0 | _aCrystallography. | |
650 | 0 | _aSpectrum analysis. | |
650 | 0 | _aSurfaces (Physics). | |
650 | 1 | 4 | _aPhysics. |
650 | 2 | 4 | _aOptical Spectroscopy, Ultrafast Optics. |
650 | 2 | 4 | _aPhysical Chemistry. |
650 | 2 | 4 | _aCrystallography. |
650 | 2 | 4 | _aSurfaces and Interfaces, Thin Films. |
650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
700 | 1 |
_aDosch, Helmut. _eeditor. |
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710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783540545347 |
786 | _dSpringer | ||
830 | 0 |
_aSpringer Tracts in Modern Physics, _x0081-3869 ; _v126 |
|
856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/BFb0045209 |
942 |
_2EBK13708 _cEBK |
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999 |
_c43002 _d43002 |