000 03392nam a22005655i 4500
001 978-3-540-45983-5
003 DE-He213
005 20160624102336.0
007 cr nn 008mamaa
008 100730s1989 gw | s |||| 0|eng d
020 _a9783540459835
_9978-3-540-45983-5
024 7 _a10.1007/BFb0045229
_2doi
050 4 _aQC170-197
050 4 _aQC717.6-718.8
072 7 _aPHM
_2bicssc
072 7 _aSCI074000
_2bisacsh
072 7 _aSCI051000
_2bisacsh
082 0 4 _a539
_223
245 1 0 _aScattering of Thermal Energy Atoms
_h[electronic resource] :
_bfrom Disordered Surfaces /
_cedited by Bene Poelsema, George Comsa.
260 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c1989.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c1989.
300 _aVIII, 110 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSpringer Tracts in Modern Physics,
_x0081-3869 ;
_v115
505 0 _aExperimental -- The scattering mechanism -- Diffuse scattering as a tool to probe the lateral distribution of adatoms and vacancies (Homogeneous systems) -- Diffuse scattering as a probe of the lateral distribution in heterogeneous systems -- The characterization of stepped surfaces by means of coherent and diffuse helium scattering -- TEAS as a probe of thermal roughness on monocrystalline surfaces -- TEAS as a probe of surface coverage.
520 _aA variety of novel applications for the investigation of disordered surfaces by beams of thermal energy atoms are discussed and illustrated by numerous examples. A straightforward semiclassical approach is introduced to yield a remarkably detailed insight into the lateral distributions of diffuse scatterers such as adsorbates, vacancies and atomic steps. The recent discovery that the long range Van der Waals force is the cause of the unusually large cross-sections for diffuse He-scattering on individual defects and impurities led the authors to propose a new methods of surface analysis. They introduce a semiclassical method, the overlap approach, to give a simple and detailed description of He-scattering from disordered surfaces. The method yields subtle, otherwise hardly obtainable information on the nature of interactions between diffuse scatterers. The authors address such questions as the lateral distribution of adsorbates, two-dimensional phase transitions, surface diffusions, and the morphology of growing or sputtered layers.
650 0 _aPhysics.
650 0 _aChemistry, Physical organic.
650 0 _aPlasma (Ionized gases).
650 0 _aCrystallography.
650 0 _aSurfaces (Physics).
650 1 4 _aPhysics.
650 2 4 _aAtoms, Molecules, Clusters and Plasmas.
650 2 4 _aSurfaces and Interfaces, Thin Films.
650 2 4 _aPhysical Chemistry.
650 2 4 _aCrystallography.
700 1 _aPoelsema, Bene.
_eeditor.
700 1 _aComsa, George.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783540503583
786 _dSpringer
830 0 _aSpringer Tracts in Modern Physics,
_x0081-3869 ;
_v115
856 4 0 _uhttp://dx.doi.org/10.1007/BFb0045229
942 _2EBK13700
_cEBK
999 _c42994
_d42994