000			02261nam a22004455i 4500
001			978-3-540-38910-1
003			DE-He213
005			20160624101844.0
007			cr nn 008mamaa
008			121227s1984 gw | s |||| 0|eng d
020			_a9783540389101 _9978-3-540-38910-1
024	7		_a10.1007/BFb0025745 _2doi
050		4	_aQD901-999
072		7	_aPHFC _2bicssc
072		7	_aSCI016000 _2bisacsh
082	0	4	_a548 _223
245	1	0	_aNovel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials _h[electronic resource] / _cedited by Yoshio Waseda.
260		1	_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c1984.
264		1	_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c1984.
300			_aVI, 186 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aLecture Notes in Physics, _x0075-8450 ; _v204
505	0		_aA brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects.
650		0	_aPhysics.
650		0	_aCrystallography.
650	1	4	_aPhysics.
650	2	4	_aCrystallography.
700	1		_aWaseda, Yoshio. _eeditor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9783540133599
786			_dSpringer
830		0	_aLecture Notes in Physics, _x0075-8450 ; _v204
856	4	0	_uhttp://dx.doi.org/10.1007/BFb0025745
942			_2EBK2277 _cEBK
999			_c31571 _d31571