000 00463nam a2200169 4500
008 160616s2001 000 0
245 _aPlasma Charging Damage
100 _aCheung, Kin P.
260 _aLondon
260 _bSpringer
260 _c2001
300 _a346
020 _a1 8523 144 5
650 _aSemiconductors - Effect of Radiation on-
_aMetal Oxide Semiconductors - Defects
_aPlasma Radiation
942 _cBK
_2BK16521
080 _a533.9 CHE
999 _c16521
_d16521