TY  - BOOK
AU  - Campilho,Aurélio
AU  - Kamel,Mohamed
ED  - SpringerLink (Online service)
TI  - Image Analysis and Recognition: International Conference ICIAR 2004, Porto, Portugal, September 29- October 1, 2004, Proceedings, Part I 
T2  - Lecture Notes in Computer Science,
SN  - 9783540301257
AV  - TA1637-1638 
U1  - 006.6 23
PY  - 2004///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg
KW  - Computer science
KW  - Text processing (Computer science
KW  - Computer graphics
KW  - Computer vision
KW  - Optical pattern recognition
KW  - Computer Science
KW  - Image Processing and Computer Vision
KW  - Document Preparation and Text Processing
KW  - Computer Graphics
KW  - Pattern Recognition
N1  - Image Segmentation -- Image Processing and Analysis -- Image Analysis and Synthesis -- Image and Video Coding -- Shape and Matching -- Image Description and Recognition -- Video Processing and Analysis -- 3D Imaging -- Image Retrieval and Indexing -- Morphology
N2  - ICIAR 2004, the International Conference on Image Analysis and Recognition, was the ?rst ICIAR conference, and was held in Porto, Portugal. ICIAR will be organized annually, and will alternate between Europe and North America. ICIAR 2005 will take place in Toronto, Ontario, Canada. The idea of o?ering these conferences came as a result of discussion between researchers in Portugal and Canada to encourage collaboration and exchange, mainly between these two countries, but also with the open participation of other countries, addressing recent advances in theory, methodology and applications. The response to the call for papers for ICIAR 2004 was very positive. From 316 full papers submitted, 210 were accepted (97 oral presentations, and 113 - sters). The review process was carried out by the Program Committee members and other reviewers; all are experts in various image analysis and recognition areas. Each paper was reviewed by at least two reviewing parties. The high q- lity of the papers in these proceedings is attributed ?rst to the authors, and second to the quality of the reviews provided by the experts. We would like to thank the authors for responding to our call, and we wholeheartedly thank the reviewers for their excellent work in such a short amount of time. We are espe- ally indebted to the Program Committee for their e?orts that allowed us to set up this publication. We were very pleased to be able to include in the conference, Prof. Murat KuntfromtheSwissFederalInstituteofTechnology,andProf. Mario ´ Figueiredo, oftheInstitutoSuperiorT´ ecnico,inPortugal
UR  - http://dx.doi.org/10.1007/b100437
ER  -