TY  - BOOK
AU  - Daillant,Jean
AU  - Gibaud,Alain
ED  - SpringerLink (Online service)
TI  - X-ray and Neutron Reflectivity: Principles and Applications
T2  - Lecture Notes in Physics Monographs,
SN  - 9783540486961
AV  - QC176-176.9 
U1  - 530.41 23
PY  - 1999///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg
KW  - Physics
KW  - Particle acceleration
KW  - Particles (Nuclear physics)
KW  - Surfaces (Physics)
KW  - Solid State Physics and Spectroscopy
KW  - Surfaces and Interfaces, Thin Films
KW  - Particle Acceleration and Detection, Beam Physics
N1  - Principles -- The Interaction of X-rays (and Neutrons) with Matter -- Statistical Aspects of Wave Scattering at Rough Surfaces -- Specular Reflectivity from Smooth and Rough Surfaces -- Diffuse Scattering -- Neutron Reflectometry -- Applications -- Statistical Physics at Crystal Surfaces -- Experiments on Solid Surfaces -- X-ray Reflectivity by Rough Multilayers -- Reflectivity of Liquid Surfaces and Interfaces -- polymer Studies
N2  - The book is the first comprehensive introduction to x-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next. The approximations are rigorously introduced and many experimental effects are discussed. In the case of neutron reflectivity, particular attention is paid to the reflectivity of polarized neutrons from magnetic multilayers, which allows the determination of in-plane magnetization profiles. Many applications are reviewed in the second part: rough surfaces, interfaces and multilayers, liquid surfaces and soft-condensed matter, and thin polymer films. In each case the underlying physics is first introduced, then specific experimental methods are described. The book addresses researchers and graduate students
UR  - http://dx.doi.org/10.1007/3-540-48696-8
ER  -