TY  - BOOK
AU  - Waseda,Yoshio
ED  - SpringerLink (Online service)
TI  - Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials
T2  - Lecture Notes in Physics,
SN  - 9783540389101
AV  - QD901-999 
U1  - 548 23
PY  - 1984///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg
KW  - Physics
KW  - Crystallography
N1  - A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects
UR  - http://dx.doi.org/10.1007/BFb0025745
ER  -